Enhancing the sensitivity of nano-FTIR spectroscopy

Hermann P. (DPM), Kästner B., Hoehl A. (DPM), Kashcheyevs V., Patoka P. (BEV), Ulrich G. (BEV), Feikes J., Ries M., Tydecks T., Beckhoff B., Ruhl E. (BEV), Ulm G.

Instrumentation, measurement, and metrology; Near-field microscopy

Document type Article
Journal title / Source Optics Express
Volume 25
Issue 14
Page numbers / Article number 16574
Publisher's name The Optical Society
Publication date 2017-7
ISSN 1094-4087
DOI 10.1364/OE.25.016574
Web URL https://www.osapublishing.org/DirectPDFAccess/158D237A-A0E8-5960-84426107CE1CBCF4_369006/oe-25-14-16574.pdf?da=1&id=369006&seq=0&mobile=no
Language English

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