New metrology for radon at the environmental level
Röttger, A., Röttger, S., Grossi, C., Vargas, A., Curcoll, R., Otáhal, P., Hernández-Ceballos, M.Á., Cinelli, G., Chambers, S., Barbosa, S.A., Ioan, M-R., Radulescu, I., Kikaj, D., Chung, E., Arnold, T., Yver Kwok, C., Fuente, M., Mertes, F. and Morosh, V.radon, metrology, tracer, environmental measurements
| Document type | Article |
| Journal title / Source | Measurement Science and Technology |
| Publisher's name | IOP Publishing |
| Publication date | 2021-09-23 |
| ISSN | 0957-0233, 1361-6501 |
| DOI | 10.1088/1361-6501/ac298d |
| Language | English |