New metrology for radon at the environmental level

Röttger A., Röttger S., Grossi C., Vargas A., Curcoll R., Otáhal P., Hernández-Ceballos M.Á., Cinelli G., Chambers S., Barbosa S.A., Ioan M-R., Radulescu I., Kikaj D., Chung E., Arnold T., Yver Kwok C., Fuente M., Mertes F., Morosh V.
Keywords:

radon, metrology, tracer, environmental measurements

Document type Article
Journal title / Source Measurement Science and Technology
Publisher's name IOP Publishing
Publication date 2021-9-23
ISSN 0957-0233, 1361-6501
DOI 10.1088/1361-6501/ac298d
Language English

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