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The EURAMET Repository Link is an online service providing links to scientific papers published within the European Metrology Research Programme (EMRP), the European Metrology Programme for Innovation and Research (EMPIR) and projects funded by iMERA-Plus.

Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis

Rotella, H., Caby, B., Ménesguen, Y., Mazel, Y., Valla, A., Ingerle, D., Detlefs, B. (CEA Laboratory of Electronics and Information Technologies (LETI), Minatec Campus, 17 rue des Martyrs, 38054 Grenoble, France), Lépy, M.-C., Novikova, A., Rodriguez, G., Streli, C. and Nolot, E. (CEA-LETI, 17 rue des Martyrs, 38054 Grenoble, France)

Combined >XRR-GIXRF, Depth profiling, thin films, TCO

Document typeArticle
Journal title / SourceSpectrochimica Acta Part B: Atomic Spectroscopy
Page numbers / Article number22-28
Publisher's nameElsevier BV
Publication date 2017-09

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