DC Characterization of AC Current Shunts for Wideband Power Applications
Rietveld Gert, van der Beek J.H.N., Houtzager ErnestCurrent shunts , current , environmental factors , measurement standards , power coefficient , power measurements , stability , temperature coefficient
Document type | Article |
Journal title / Source | IEEE Transactions on Instrumentation and Measurement |
Volume | 60 |
Issue | 7 |
Page numbers / Article number | 2191-2194 |
Publication date | 2011-7 |