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Establishing waveguide lines as primary standards for scattering parameter measurements at submillimetre wavelengths

Ridler, N. (National Physical Laboratory, Teddington, United Kingdom), Susan Johny, A., Salter, M. (National Physical Laboratory, Teddington, United Kingdom), Shang, X., Sun, W. and Wilson, A. (National Physical Laboratory, Teddington, United Kingdom)
Keywords:

metrological traceability, vector network analyser, calibration, waveguide, sub-millimetre-wave measurements, scattering parameters

Document typeArticle
Journal title / SourceMetrologia
Volume58
Issue1
Page numbers / Article number1-13
Publisher's nameIOP Publishing
Publication date 2020-12-14
ISSN0026-1394, 1681-7575
DOI10.1088/1681-7575/abd371
LanguageEnglish

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