A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model
Liu C., Wu A., Li C., Ridler N.Calibration, Crosstalk, Standards, Probes, Semiconductor device measurement, Measurement uncertainty, Numerical models, approximation theory, calibration, measurement errors, measurement standards, millimetre wave measurement, network analysers, S-parameters
| Document type | Article |
| Journal title / Source | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 66 |
| Issue | 8 |
| Page numbers / Article number | 3894-3900 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication date | 2018-8 |
| ISSN | 0018-9480, 1557-9670 |
| DOI | 10.1109/TMTT.2018.2832052 |
| Language | English |