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A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model

Liu, C., Wu, A., Li, C. and Ridler, N. (National Physical Laboratory, Teddington, United Kingdom)
Keywords:

Calibration, Crosstalk, Standards, Probes, Semiconductor device measurement, Measurement uncertainty, Numerical models, approximation theory, calibration, measurement errors, measurement standards, millimetre wave measurement, network analysers, S-parameters

Document typeArticle
Journal title / SourceIEEE Transactions on Microwave Theory and Techniques
Volume66
Issue8
Page numbers / Article number3894-3900
Publisher's nameInstitute of Electrical and Electronics Engineers (IEEE)
Publication date 2018-08
ISSN0018-9480, 1557-9670
DOI10.1109/TMTT.2018.2832052
LanguageEnglish

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