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An intra-laboratory investigation of on-wafer measurement reproducibility at millimeter-wave frequencies

Clarke, R G, Li, C (University of Science and Technology Liaoning) and Ridler, N M
Keywords:

Measurement repeatability, Measurement reproducibility, On-wafer measurements, Millimeter-wave measurements, Measurement uncertainty

Document typeProceeding
Journal title / Source2017 90th ARFTG Microwave Measurement Symposium (ARFTG)
Publisher's nameIEEE
Publisher's address (city only)445 Hoes Lane Piscataway NJ 08855-1331 United States
Publication date 2017-11-30
Conference nameARFTG 90th Microwave Measurement Conference
Conference date28-11-2017 to 01-12-2017
Conference placeBoulder, Colorado
DOI10.1109/arftg.2017.8255866
ISBN978-1-5386-4356-3
Web URLhttp://eprints.whiterose.ac.uk/125336/
LanguageEnglish

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