A finite element analysis of surface-stress effects on measurement of the Si lattice parameter measurement
Quagliotti D., Mana G., Massa E., Sasso C., Kuetgens U.Avogadro constant, Planck constant, kilogram redefinition, Si lattice parameter, surface stress
| Document type | Article |
| Journal title / Source | Metrologia |
| Volume | 50 |
| Issue | 3 |
| Publication date | 2013 |
| DOI | 10.1088/0026-1394/50/3/243 |
| Web URL | http://stacks.iop.org/Met/50/243 |