Effects Degrading Accuracy of CPW mTRL Calibration at W Band

Phung G.N., Schmuckle F.J., Doerner R. , Heinrich W., Probst T., Arz U.
Keywords:

Calibration, measurement accuracy, on-wafer measurement, probe

Document type Proceedings
Journal title / Source 2018 IEEE/MTT-S International Microwave Symposium - IMS
Page numbers / Article number 1296-1299
Publisher's name IEEE
Publisher's address (city only) 445 Hoes Lane Piscataway NJ 08855-1331 United States
Publication date 2018-6
Conference name 2018 IEEE/MTT-S International Microwave Symposium - IMS
Conference date 10-06-2018 to 15-06-2018
Conference place Philadelphia
DOI 10.1109/MWSYM.2018.8439837
Web URL https://www.fbh-berlin.com/publications-patents/publications/title/effects-degrading-accuracy-of-cpw-mtrl-calibration-at-w-band
Language English

Back to the list view