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Effects Degrading Accuracy of CPW mTRL Calibration at W Band

Phung, G.N., Schmuckle, F.J., Doerner, R., Heinrich, W., Probst, T. and Arz, U. (PTB, Braunschweig, Germany)
Keywords:

Calibration, measurement accuracy, on-wafer measurement, probe

Document typeProceeding
Journal title / Source2018 IEEE/MTT-S International Microwave Symposium - IMS
Page numbers / Article number1296-1299
Publisher's nameIEEE
Publisher's address (city only)445 Hoes Lane Piscataway NJ 08855-1331 United States
Publication date 2018-06
Conference name2018 IEEE/MTT-S International Microwave Symposium - IMS
Conference date10-06-2018 to 15-06-2018
Conference placePhiladelphia
DOI10.1109/MWSYM.2018.8439837
Web URLhttps://www.fbh-berlin.com/publications-patents/publications/title/effects-degrading-accuracy-of-cpw-mtrl-calibration-at-w-band
LanguageEnglish

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