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Impact of Substrate Modes on mTRL-Calibrated CPW Measurements in G Band

Phung, G.N., Schmuckle, F.J., Doerner, R., Heinrich, W., Probst, T. and Arz, U. (PTB, Braunschweig, Germany)
Keywords:

on-wafer probes, coplanar waveguides (CPW), substrate modes, calibration

Document typeProceeding
Journal title / Source2018 48th European Microwave Conference (EuMC)
Publisher's nameIEEE
Publication date 2018-09
Conference name2018 48th European Microwave Conference
Conference date23-09-2018 to 28-09-2018
Conference placeMadrid
DOI10.23919/EuMC.2018.8541813
Web URLhttps://www.fbh-berlin.com/publications-patents/publications/title/impact-of-substrate-modes-on-mtrl-calibrated-cpw-measurements-in-g-band
LanguageEnglish

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