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SI-traceable absolute distance measurement over more than 800 meters with sub-nanometer interferometry by two-color inline refractivity compensation

Pollinger, F., Mildner, J. (PTB), Meyer, T. and Meiners-Hagen, K.
Keywords:

Interferometry, Interferometers, Optical properties, Lasers, Optical, Long distance, refractivity-compensation, two-color, multi-wavelength interferometry

Document typeArticle
Journal title / SourceApplied Physics Letters
Volume111
Issue19
Page numbers / Article number191104
Publisher's nameAIP Publishing
Publication date 2017-11
ISSN0003-6951, 1077-3118
DOI10.1063/1.5000569
LanguageEnglish

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