SI-traceable absolute distance measurement over more than 800 meters with sub-nanometer interferometry by two-color inline refractivity compensation
Pollinger F., Mildner J., Meyer T., Meiners-Hagen K.Interferometry, Interferometers, Optical properties, Lasers, Optical, Long distance, refractivity-compensation, two-color, multi-wavelength interferometry
Document type | Article |
Journal title / Source | Applied Physics Letters |
Volume | 111 |
Issue | 19 |
Page numbers / Article number | 191104 |
Publisher's name | AIP Publishing |
Publication date | 2017-11 |
ISSN | 0003-6951, 1077-3118 |
DOI | 10.1063/1.5000569 |
Language | English |