Parasitic Probe Effects in Measurements of Coplanar Waveguides with Narrow Ground Width

Phung G.N., Arz U.
Keywords:

calibration, coplanar waveguides, multiline Thru-Reflect Line (mTRL), probes

Document type Proceedings
Journal title / Source 2020 IEEE 24th Workshop on Signal and Power Integrity (SPI)
Publisher's name IEEE
Publication date 2020-5
Conference name 2020 IEEE 24th Workshop on Signal and Power Integrity
Conference date 17-05-2020 to 20-05-2020
Conference place Cologne
DOI 10.1109/SPI48784.2020.9218166
Web URL https://oar.ptb.de/files/download/5f92a12a4c93902ba0000843
Language English

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