Prototype for dual digital traceability of metrology data using X.509 and IOTA

Peterek Martin, Montavon Benjamin
Keywords:

metrology, calibration, digital manufacturing systems

Document type Article
Journal title / Source CIRP Annals
Volume 69
Issue 1
Page numbers / Article number 449-452
Publisher's name Elsevier BV
Publication date 2020-5-20
ISSN 0007-8506
DOI 10.1016/j.cirp.2020.04.104
Web URL https://www.sciencedirect.com/science/article/pii/S0007850620301268
Language English

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