Prototype for dual digital traceability of metrology data using X.509 and IOTA
Peterek Martin, Montavon Benjaminmetrology, calibration, digital manufacturing systems
Document type | Article |
Journal title / Source | CIRP Annals |
Volume | 69 |
Issue | 1 |
Page numbers / Article number | 449-452 |
Publisher's name | Elsevier BV |
Publication date | 2020-5-20 |
ISSN | 0007-8506 |
DOI | 10.1016/j.cirp.2020.04.104 |
Web URL | https://www.sciencedirect.com/science/article/pii/S0007850620301268 |
Language | English |