Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography

Chintala R.C., Wood S., Blakesley J.C., Favia P., Celano U., Paredis K., Vandervorst W., Castro F.A.
Keywords:

conductive AFM, organic semiconductor, nanostructure, scanning probe tomography, nanowire

Document type Article
Journal title / Source AIP Advances
Volume 9
Issue 2
Page numbers / Article number 025105
Publisher's name AIP publishing
Publication date 2011-2-19
ISSN 2158-3226
DOI 10.1063/1.5066458
Web URL https://aip.scitation.org/doi/full/10.1063/1.5066458
Language English

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