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Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography

Chintala, R.C., Wood, S., Blakesley, J.C. (National Physical Laboratory, Hampton Road, Teddington, TW11 0LW, United Kingdom), Favia, P., Celano, U., Paredis, K., Vandervorst, W. (IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium and Instituut voor Kern- en Stralingsfysica, KU Leuven, Celestijnenlaan 200D, B-3001 Leuven, Belgium) and Castro, F.A.
Keywords:

conductive AFM, organic semiconductor, nanostructure, scanning probe tomography, nanowire

Document typeArticle
Journal title / SourceAIP Advances
Volume9
Issue2
Page numbers / Article number025105
Publisher's nameAIP publishing
Publication date 2011-02-19
ISSN2158-3226
DOI10.1063/1.5066458
Web URLhttps://aip.scitation.org/doi/full/10.1063/1.5066458
LanguageEnglish

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