AIM QuTE: Automated Impedance Metrology extending the Quantum Toolbox for Electricity
Palafox L., Raso F., Kucera J., Overney F., Callegaro L., Gournay P., Ziołek A., Nissilä J., Eklund G., Lippert T., Gülmez Y., Fleischmann P., Kampik M., Rybski R.Document type | Proceedings |
Journal title / Source | Digest |
Publication date | 2014 |
Conference name | 16th International Congress of Metrology |
Conference date | 7-10 October 2013 |
Conference place | Paris, France |
DOI | 10.1051/metrology/201311001 |
Web URL | http://cfmetrologie.edpsciences.org/articles/metrology/abs/2013/01/metrology_metr2013_11001/metrology_metr2013_11001.html |