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Optical frequency analysis on dark state of a single trapped ion

Obšil, P., Slodička, L., Číp, O. (ISI), Čížek, M. (ISI), Lešundák, A. (ISI, VSL) and Pham, T.M.
Keywords:

Optical frequency analysis, dark state of a single trapped ion

Document typeArticle
Journal title / SourceOptics Express
Volume28
Issue9
Page numbers / Article number13091
Publisher's nameThe Optical Society
Publication date 2020-04-16
ISSN1094-4087
DOI10.1364/OE.389411
LanguageEnglish

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