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Reference standards for XCT measurements of additively manufactured parts 

Obaton, A., Klingaa, C., Rivet, C., Mohaghegh, K., Baier, S., Andreasen, J., Carli, L. and De Chiffre, L.
Keywords:

X-ray computed tomography (XCT), dimensional metrology, reference standards, additive manufacturing

Document typeProceeding
Journal title / SourceProceedings of the 10th Conference on Industrial Computed Tomography (iCT) 2020
Page numbers / Article number152
Publication date 2020-02
Conference name10th Conference on Industrial Computed Tomography (iCT 2020)
Conference date04-02-2020 to 07-02-2020
Conference placeWels, Austria
Web URLhttps://www.ndt.net/article/ctc2020/papers/ICT2020_paper_id152.pdf
LanguageEnglish
Persistent Identifierhttps://www.ndt.net/article/ctc2020/papers/ICT2020_paper_id152.pdf

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