Ultra-high precision CMMs as well as tactile and optical single scanning probes evaluation in dimensional metrology
Nouira H, Bergmans R H, Küng A., Piree H, Henselmans R., Spaan H.A.M.measuring machine, chromatic confocal probe; tactile probe, error sources; dimensional and mechanical metrology, evaluation
Document type | Article |
Journal title / Source | International Journal of Metrology and Quality Engineering |
Publication date | 2014 |
ISSN | 2107-6839 |