A generalized modeling approach for the frequency shift in near-field scanning microwave microscopes

Niegemann J.
Document type Proceedings
Journal title / Source Proceedings of 2013 International Conference on Electromagnetics in Advanced Applications (ICEAA)
Page numbers / Article number 1145 - 1148
Publication date 2013
Conference name 2013 International Conference on Electromagnetics in Advanced Applications (ICEAA)
Conference date 9 - 13 September
Conference place Torino, Italy
DOI 10.1109/ICEAA.2013.6632422
Web URL http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6632422

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