Synthetic Data in Quantitative Scanning Probe Microscopy

Nečas D., Klapetek P.
Keywords:

nanometrology; data synthesis; scanning probe microscopy

Document type Article
Journal title / Source Nanomaterials
Volume 11
Issue 7
Page numbers / Article number 1746
Publisher's name MDPI AG
Publication date 2021-7
ISSN 2079-4991
DOI 10.3390/nano11071746
Web URL https://www.mdpi.com/2079-4991/11/7/1746
Language English

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