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Noise Behavior and Implementation of Interferometer-Based Broadband VNA

Mubarak, F.A. (Van Swinden Laboratorium (VSL), Thijsseweg 11, 2629 JA Delft, The Netherlands), Romano, R. (Delft University of Technology), Galatro, L., Mascolo, V., Rietveld, G. and Spirito, M. (TU Delft)
Keywords:

extreme impedance measurement, impedance mismatch, microwave interferometry, nanoelectronics, nanostructures, noise, vector network analyzer

Document typeArticle
Journal title / SourceIEEE Transactions on Microwave Theory and Techniques
Volume67
Issue1
Page numbers / Article number249-260
Publisher's nameInstitute of Electrical and Electronics Engineers (IEEE)
Publication date 2018-12
ISSN0018-9480, 1557-9670
DOI10.1109/TMTT.2018.2874667
Web URLhttps://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8566175
LanguageEnglish

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