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Automated Contacting of On-Wafer Devices for RF Testing

Mubarak, F., Martino, C.D., Toskovic, R., Rietveld, G. and Spirito, M. (TU Delft)

On-wafer probing, on-wafer contacting, microwave measurements, measurement techniques, measurement uncertainty, precision measurements, uncertainty

Document typeProceeding
Journal title / Source2020 Conference on Precision Electromagnetic Measurements (CPEM)
Page numbers / Article number1-2
Publisher's nameIEEE
Publication date 2020-09-10
Conference name2020 Conference on Precision Electromagnetic Measurements (CPEM)
Conference date24-08-2020 to 28-08-2020
Conference placeDenver (Aurora), CO, USA, USA
Web URLhttps://zenodo.org/record/4276095
Persistent Identifierhttps://doi.org/10.1109/CPEM49742.2020.9191800

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