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Structure‐Dependent Influence of Moisture on Resistive Switching Behavior of ZnO Thin Films

Milano, G., Luebben, M., Laurenti, M., Boarino, L. (Istituto Nazionale di Ricerca Metrologica (INRiM)), Ricciardi, C. and Valov, I.
Keywords:

effect of moisture on electroforming, electrical conductivity, memristors, nanostructures, resistive switching

Document typeArticle
Journal title / SourceAdvanced Materials Interfaces
Volume8
Issue16
Page numbers / Article number2100915
Publisher's nameWiley
Publication date 2021-07-28
ISSN2196-7350, 2196-7350
DOI10.1002/admi.202100915
Web URLhttps://onlinelibrary.wiley.com/doi/10.1002/admi.202100915
LanguageEnglish

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