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Measurement and control of single-photon microwave radiation on chip

Manninen, A.J. (VTT, Finland), Kemppinen, A., Enrico, E. (Istituto Nazionale di Ricerca Metrologica (INRiM)), Kataoka, M., Lindstrom, T., Zorin, A.B., Lotkhov, S.V., Khabipov, M., Möttönen, M., Lake, R.E., Govenius, J., Pekola, J.P., Pashkin, Yu.A., Meeson, P.J. and Astafiev, O.V. (Physics Department, Royal Holloway, University of London, Egham, Surrey TW20 0EX, United Kingdom)
Keywords:

Cryoelectronics, electromagnetic shielding, microwave photons, microwave sensors, microwave sources, nanoelectronics, single-electron devices, superconducting microwave devices, superconducting qubits

Document typeProceeding
Journal title / Source29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
Page numbers / Article number324-325
Publisher's nameIEEE
Publication date 2014-08
Conference name29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
Conference date24-08-2014 to 29-08-2014
Conference placeRio de Janeiro, Brazil
DOI10.1109/CPEM.2014.6898390
LanguageEnglish

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