NPL freeform artefact for verification of non-contact measuring systems

McCarthy M., Brown S., Evenden A., Robinson A.
Document type Proceedings
Journal title / Source SPIE Proceedings of 23rd Annual Symposium of Electronic Imaging
Volume 7864
Issue 78640K
Publication date 2011-2
Conference name SPIE 23rd Annual Symposium of Electronic Imaging
Conference date 23 - 27 January 2011
Conference place San Francisco, CA, USA
Web URL http://spiedigitallibrary.org/proceedings/resource/2/psisdg/7864/1/78640K_1?isAuthorized=no

Back to the list view