NPL freeform artefact for verification of non-contact measuring systems
McCarthy M., Brown S., Evenden A., Robinson A.Document type | Proceedings |
Journal title / Source | SPIE Proceedings of 23rd Annual Symposium of Electronic Imaging |
Volume | 7864 |
Issue | 78640K |
Publication date | 2011-2 |
Conference name | SPIE 23rd Annual Symposium of Electronic Imaging |
Conference date | 23 - 27 January 2011 |
Conference place | San Francisco, CA, USA |
Web URL | http://spiedigitallibrary.org/proceedings/resource/2/psisdg/7864/1/78640K_1?isAuthorized=no |