Measurement of the {2 2 0} lattice-plane spacing of a 28Si x-ray interferometer
Massa E., Mana G., Kuetgens U., Ferroglio L.lattice-plane spacing, Avogadro constant, x-ray interferometer
Document type | Article |
Journal title / Source | Metrologia |
Volume | 48 |
Issue | 2 |
Publication date | 2011-3-22 |
DOI | 10.1088/0026-1394/48/2/S06 |