Measurement of the lattice parameter of a silicon crystal
Massa E., Mana G., Kuetgens U., Ferroglio L.X-ray optics; X-ray interferometry; instrumentation, measurement and metrology; interferometry.
| Document type | Article |
| Journal title / Source | New Journal of Physics |
| Volume | 11 |
| Issue | 053013 |
| Page numbers / Article number | 12 pages |
| Publication date | 2009-5-27 |