Novel devices and methods for quantum resistance and impedance metrology

Marzano M.
Keywords:

resistance metrology, impedance metrology, quantum Hall effect, impedance bridge, fully-digital impedance bridge

Document type Thesis
Journal title / Source
University name Politecnico di Torino, Torino, Italy
Publication date 2020-1-13
Language English
Persistent Identifier http://hdl.handle.net/11583/2779393

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