Theoretical and experimental determination of K- and L-shell x-ray relaxation parameters in Ni
Guerra M., Sampaio J. M., Parente F., Indelicato P., Honicke P., Muller M., Beckhoff B., Marques J. P., Santos J. P.Electronic Structure, X-ray Fluorescence, Fundamental Parameters, Fluorescence Yields, Condensed matter
| Document type | Article |
| Journal title / Source | Physical Review A |
| Volume | 97 |
| Issue | 4 |
| Page numbers / Article number | 042501 |
| Publisher's name | American Physical Society (APS) |
| Publisher's address (city only) | 1 Research Rd Attn: Robert Kelly Attn: Mark Doyle Ridge 11961-9000 United States |
| Publication date | 2018-4 |
| ISSN | 2469-9926, 2469-9934 |
| DOI | 10.1103/PhysRevA.97.042501 |
| Web URL | https://journals.aps.org/pra/abstract/10.1103/PhysRevA.97.042501 |
| Language | English |