Random-telegraph-noise by resonant tunnelling at low temperatures

Li Z., Sotto M., Liu F., Husain M.K., Zeimpekis I., Yoshimoto H., Tani K., Sasago Y., Hisamoto D., Fletcher J.D., Kataoka M., Tsuchiya Y., Saito S.
Keywords:

Random-telegraph-noise, charge trap, low temperatures

Document type Proceedings
Journal title / Source 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM)
Publisher's name IEEE
Publication date 2017-2-28
Conference name 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM)
Conference date 28-02-2017 to 02-03-2017
Conference place Toyama
DOI 10.1109/EDTM.2017.7947569
Web URL https://eprints.soton.ac.uk/418401/
Language English

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