Welcome to the EURAMET Repository Link

The EURAMET Repository Link is an online service providing links to scientific papers published within the European Metrology Research Programme (EMRP), the European Metrology Programme for Innovation and Research (EMPIR) and projects funded by iMERA-Plus.

Development of a Reference Wafer for On-wafer Testing of Extreme Impedance Devices

Votsi, H., Roch-Jeune, I., Haddadi, K. (IEMN-Univ-Lille1, France), Li, C., Dambrine, G. (IEMN-Univ-Lille1, France), Aaen, P.H. (University of Surrey, Guilford, United Kingdom) and Ridler, N. (National Physical Laboratory, Teddington, United Kingdom)
Keywords:

Standards, Calibration, Impedance, Nanoscale devices, Impedance measurement, Probes, Transmission line measurements, extreme impedance measurement, Calibration, on-wafer measurement, nano-scale, co-planar waveguide, RF nanotechnology

Document typeProceeding
Journal title / SourceIEEE XPlore
Publisher's nameIEEE
Publisher's address (city only)USA & Canada
Publication date 2016
Conference nameMicrowave Measurement Conference (ARFTG)
Conference date08-12-2016 to 09-12-2016
Conference placeAustin, TX, USA
DOI10.1109/ARFTG.2016.7839719
Web URLhttp://epubs.surrey.ac.uk/813783/1/Votsi_88th_ARFTG_Paper_Summary%20%28002%29.pdf
LanguageEnglish

Back to the list view