Irradiated Silicon for Microwave and Millimeter Wave Applications

Krupka J., Salski B., Karpisz T., Kopyt P., Jensen L., Wojciechowski M.

Microwave measurement, millimeter wave measurement, permittivity, silicon

Document type Article
Journal title / Source IEEE Microwave and Wireless Components Letters
Volume 32
Issue 6
Page numbers / Article number 700-703
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publication date 2022-6
ISSN 1531-1309, 1558-1764
DOI 10.1109/LMWC.2022.3161393
Language English

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