Irradiated Silicon for Microwave and Millimeter Wave Applications

Krupka J., Salski B., Karpisz T., Kopyt P., Jensen L., Wojciechowski M.
Keywords:

Microwave measurement, millimeter wave measurement, permittivity, silicon

Document type Article
Journal title / Source IEEE Microwave and Wireless Components Letters
Volume 32
Issue 6
Page numbers / Article number 700-703
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publication date 2022-6
ISSN 1531-1309, 1558-1764
DOI 10.1109/LMWC.2022.3161393
Language English

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