Impact of Imperfect Artefacts and the Modus Operandi on Uncertainty Quantification Using Virtual Instruments

Kok G., Wübbeler G., Elster C.
Keywords:

virtual instrument; uncertainty calculation; VCMM; artefact imperfection; form deviation

Document type Article
Journal title / Source Metrology
Volume 2
Issue 2
Page numbers / Article number 311-319
Publisher's name MDPI AG
Publication date 2022-6-12
ISSN 2673-8244
DOI 10.3390/metrology2020019
Web URL https://www.mdpi.com/2673-8244/2/2/19/htm
Language English

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