Material Parameter Extraction in THz Domain, Simplifications and Sensitivity Analysis

Kazemipour A., Wollensack M., Hoffmann J., Yee S-K., Rüfenacht J., Gäumann G., Hudlicka M., Zeier M.
Keywords:

material characterization, extraction method, THz domain, sensitivity coefficient, measurement uncertainty

Document type Proceedings
Journal title / Source 2019 IEEE Asia-Pacific Microwave Conference (APMC)
Volume N/A
Issue N/A
Page numbers / Article number 276-278
Publisher's name IEEE
Publication date 2019-12
Conference name 019 IEEE Asia-Pacific Microwave Conference (APMC)
Conference date 10-12-2019 to 13-12-2019
Conference place Singapore
ISSN N/A
DOI 10.1109/APMC46564.2019.9038523
ISBN 978-1-7281-3517-5
Web URL https://doi.org/10.5281/zenodo.4243025
Language English

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