Analytical Uncertainty Evaluation of Material Parameter Measurements at THz Frequencies

Kazemipour A., Wollensack M., Hoffmann J., Hudlicka M., Yee S-K., Rüfenacht J., Stalder D., Gäumann G., Zeier M.
Keywords:

Material characterization, Extraction method, THz domain, Sensitivity coefficient, Measurement uncertainty, RF metrology

Document type Article
Journal title / Source Journal of Infrared, Millimeter, and Terahertz Waves
Volume 41
Issue 10
Page numbers / Article number 1199 - 1217
Publisher's name Springer Science and Business Media LLC
Publication date 2020-7-24
ISSN 1866-6892, 1866-6906
DOI 10.1007/s10762-020-00723-0
Language English

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