Standard Load Method: A New Calibration Technique for Material Characterization at Terahertz Frequencies

Kazemipour A., Hoffmann J., Wollensack M., Hudlicka M., Rüfenacht J., Stalder D., Allal D., Gäumann G., Zeier M.
Keywords:

Material characterization, measurement uncertainty, parameter extraction, standard load, vector network analyzer (VNA) time gating

Document type Article
Journal title / Source IEEE Transactions on Instrumentation and Measurement
Volume 70
Issue N/A
Page numbers / Article number 1007310
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publication date 2021-5
ISSN 0018-9456, 1557-9662
DOI 10.1109/TIM.2021.3077660
Language English

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