VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating

Kazemipour A., Hoffmann J., Wollensack M., Allal D., Hudlicka M., Ruefenacht J., Stalder D., Zeier M.
Keywords:

Material characterization, parameter extraction, VNA time-gating, RF metrology, measurement uncertainty

Document type Proceedings
Journal title / Source 2020 Conference on Precision Electromagnetic Measurements (CPEM)
Volume N/A
Issue N/A
Page numbers / Article number 1-2
Publisher's name IEEE
Publication date 2020-8
Conference name 2020 Conference on Precision Electromagnetic Measurements (CPEM)
Conference date 24-08-2020 to 28-08-2020
Conference place Denver, CO, USA
ISSN 2160-0171
DOI 10.1109/CPEM49742.2020.9191818
ISBN 978-1-7281-5898-3
Web URL https://doi.org/10.5281/zenodo.4243044
Language English

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