Novel mechanistic model and computational approximation for electromagnetic safety evaluations of electrically short implants

Liorni I., Neufeld E., Kühn S., Murbach M., Zastrow E., Kainz W.
Keywords:

implants, safety, mechanistic model, electromagnetic fields, numerical dosimetry, standardization activities

Document type Article
Journal title / Source Physics in Medicine & Biology
Volume 63
Issue 22
Page numbers / Article number 225015
Publisher's name IOP Publishing
Publication date 2018-11-12
ISSN 1361-6560
DOI 10.1088/1361-6560/aae94c
Web URL http://iopscience.iop.org/article/10.1088/1361-6560/aae94c/pdf
Language English

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