Form measurements by optical and tactile scanning
Jusko Otto, Neugebauer Michael, Reimann Helge, Drabarek P., Fleischer M., Gnausch T.form measurement, optical probe, tactile probe, scanning CMM
Document type | Proceedings |
Journal title / Source | Proceedings Fifth International Symposium on Instrumentation Science and Technology |
Publication date | 2008 |
Conference name | 5th International Symposium on Instrumentation Science and Technology |
Conference date | 15-18 September 2008 |
Conference place | Shenyang, China |