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Single Carrier Trapping and De-trapping in Scaled Silicon Complementary Metal-Oxide-Semiconductor Field-Effect Transistors at Low Temperatures

Li, Zuo, Husain, Muhammad, Yoshimoto, Hiroyuki, Tani, Kazuki, Sasago, Yoshitaka, Hisamoto, Digh, Fletcher, Jonathan, Kataoka, Masaya, Tsuchiya, Yoshishige and Saito, Shinichi
Keywords:

Coulomb blockade, MOSFETs, Carrier Trapping and De-trapping, quantum dots

Document typeArticle
Journal title / SourceSemiconductor Science and Technology
Publisher's nameIOP Publishing
Publication date 2017-03-24
ISSN0268-1242, 1361-6641
DOI10.1088/1361-6641/aa6910
LanguageEnglish

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