Artifact-free coordinate registration of heterogeneous Large-Scale Metrology systems

Pfeifer T., Montavon B., Peterek M., Hughes B.
Keywords:

Metrology, Sensor, Uncertainty

Document type Article
Journal title / Source CIRP Annals
Volume 68
Issue 1
Page numbers / Article number 503-506
Publisher's name Elsevier BV
Publication date 2019
ISSN 0007-8506
DOI 10.1016/j.cirp.2019.04.077
Language English

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