Development of a high-accuracy multi-sensor, multi-target coordinate metrology system using frequency scanning interferometry and multilateration
Hughes B., Campbell M. A., Lewis A. J., Lazzarini G. M., Kay N.Interferometry, large volume metrology, sensors, distance measurement, calibration, traceability
| Document type | Article |
| Journal title / Source | Proc. SPIE |
| Volume | 10332 |
| Page numbers / Article number | 1033202 |
| Publisher's name | SPIE |
| Publication date | 2017-6-26 |
| DOI | 10.1117/12.2273644 |
| Language | English |