Towards a calibration of laboratory setups for grazing incidence and total-reflection X-ray fluorescence analysis

Honicke P., Waldschläger U., Wiesner T., Krämer M., Beckhoff B.
Keywords:

Gracing incidence X-ray fluorescenceLaboratory setupSolid angle characterization

Document type Article
Journal title / Source Spectrochimica Acta Part B: Atomic Spectroscopy
Volume 174
Page numbers / Article number 106009
Publisher's name Elsevier BV
Publication date 2020-11
ISSN 0584-8547
DOI 10.1016/j.sab.2020.106009
Web URL https://arxiv.org/abs/2003.05192
Language English

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