Analysis of Mesoporous Iridium Oxide Thin Films by the Combined Methodical Approach SEM/EDS/STRATAGem
Sachse R., Hertwig A., Kraehnert R., Hodoroaba V.D.Electron probe microanalysis (EPMA); Iridium oxide; Porous thin films; Spectroscopic ellipsometry
| Document type | Proceedings |
| Journal title / Source | Proceedings of Microscopy & Microanalysis 2018 |
| Volume | 24 |
| Page numbers / Article number | 762-763 |
| Publisher's name | Cambridge University Press (CUP) |
| Publication date | 2018-8 |
| Conference name | Microscopy & Microanalysis 2018 |
| Conference date | 05-08-2018 to 09-08-2018 |
| Conference place | Baltimore, Maryland, USA |
| ISSN | 1431-9276, 1435-8115 |
| DOI | 10.1017/S1431927618004300 |
| Language | English |