Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz
Arz, U. (PTB, Braunschweig, Germany), Kuhlmann, K. (PTB, Braunschweig, Germany), Dziomba, T. (Physikalisch-Technische Bundesanstalt, Braunschweig, Germany), Hechtfischer, G., Phung, G., Schmückle, F. and Heinrich, W.Calibration, on-wafer, S-parameters, traceability, uncertainty budget
| Document type | Article |
| Journal title / Source | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES |
| Volume | t.b.d. |
| Page numbers / Article number | 1-10 |
| Publisher's name | IEEE |
| Publication date | 2018-04-19 |
| DOI | 10.1109/TMTT.2019.2908857 |
| Web URL | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8693763 |
| Language | English |